<mets:mets xsi:schemaLocation="http://www.loc.gov/METS/ http://www.loc.gov/standards/mets/mets.xsd http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-3.xsd" OBJID="eprint_98791" LABEL="Eprints Item" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:mets="http://www.loc.gov/METS/" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:mods="http://www.loc.gov/mods/v3"><mets:metsHdr CREATEDATE="2026-11-06T16:11:52Z"><mets:agent TYPE="ORGANIZATION" ROLE="CUSTODIAN"><mets:name>Arxiv Universal Publishings</mets:name></mets:agent></mets:metsHdr><mets:dmdSec ID="DMD_eprint_98791_mods"><mets:mdWrap MDTYPE="MODS"><mets:xmlData><mods:titleInfo><mods:title>YARIMO‘TKAZGICHLAR VA ULARNING FIZIK-KIMYOVIY XOSSALARI.</mods:title></mods:titleInfo><mods:name type="personal"><mods:namePart type="given">Jo‘rayev G‘ulomjon</mods:namePart><mods:namePart type="family">Jo‘rayev G‘ulomjon</mods:namePart><mods:role><mods:roleTerm type="text">author</mods:roleTerm></mods:role></mods:name><mods:name type="personal"><mods:namePart type="given">Toshboyev Olmos</mods:namePart><mods:namePart type="family">Toshboyev Olmos</mods:namePart><mods:role><mods:roleTerm type="text">author</mods:roleTerm></mods:role></mods:name><mods:name type="personal"><mods:namePart type="given">Qobilov Dilmurod</mods:namePart><mods:namePart type="family">Qobilov Dilmurod</mods:namePart><mods:role><mods:roleTerm type="text">author</mods:roleTerm></mods:role></mods:name><mods:name type="personal"><mods:namePart type="given">Oʻralov</mods:namePart><mods:namePart type="family">Shaxriyor</mods:namePart><mods:role><mods:roleTerm type="text">author</mods:roleTerm></mods:role></mods:name><mods:abstract>To systematize the analysis of crystal structure, physicochemical properties, electrical conductivity mechanisms, and technological applications of semiconductor materials. Comparative analysis was conducted based on solid-state physics, band theory, synthesis of experimental data, and computational modeling (DFT, Drude–Sommerfeld approach). Quantitative evaluation of band gap energies (Si: 1.12 eV, Ge: 0.66 eV), charge carrier mobility, temperature-dependent conductivity, and doping effects for Si, Ge, and compound semiconductors (GaAs, SiC, GaN) was performed. A precise understanding of physicochemical parameters is critical for enhancing semiconductor device performance and advancing wide-bandgap materials and nanotechnologies.&#13;
&amp;nbsp;</mods:abstract><mods:originInfo><mods:dateIssued encoding="iso8601">2026-06-11</mods:dateIssued></mods:originInfo><mods:genre>Maqola</mods:genre></mets:xmlData></mets:mdWrap></mets:dmdSec><mets:amdSec ID="TMD_eprint_98791"><mets:rightsMD ID="rights_eprint_98791_mods"><mets:mdWrap MDTYPE="MODS"><mets:xmlData><mods:useAndReproduction>
<p xmlns="http://www.w3.org/1999/xhtml"><strong>For work being deposited by its own author:</strong>
In self-archiving this collection of files and associated bibliographic
metadata, I grant Arxiv Universal Publishings the right to store
them and to make them permanently available publicly for free on-line.
I declare that this material is my own intellectual property and I
understand that Arxiv Universal Publishings does not assume any
responsibility if there is any breach of copyright in distributing these
files or metadata. (All authors are urged to prominently assert their
copyright on the title page of their work.)</p>

<p xmlns="http://www.w3.org/1999/xhtml"><strong>For work being deposited by someone other than its
author:</strong> I hereby declare that the collection of files and
associated bibliographic metadata that I am archiving at
Arxiv Universal Publishings is in the public domain. If this is
not the case, I accept full responsibility for any breach of copyright
that distributing these files or metadata may entail.</p>

<p xmlns="http://www.w3.org/1999/xhtml">Clicking on the <em>Deposit Item Now</em> button indicates your agreement to these
terms.</p>
    </mods:useAndReproduction></mets:xmlData></mets:mdWrap></mets:rightsMD></mets:amdSec><mets:fileSec><mets:fileGrp USE="reference"><mets:file OWNERID="https://arxiv.universalpublishings.com/id/eprint/98791/1/38-42.pdf" MIMETYPE="application/pdf" SIZE="307322" ID="eprint_98791_20411_1"><mets:FLocat xlink:href="https://arxiv.universalpublishings.com/id/eprint/98791/1/38-42.pdf" xlink:type="simple" LOCTYPE="URL"></mets:FLocat></mets:file></mets:fileGrp></mets:fileSec><mets:structMap><mets:div ADMID="TMD_eprint_98791" DMDID="DMD_eprint_98791_mods"><mets:fptr FILEID="eprint_98791_document_20411_1"></mets:fptr></mets:div></mets:structMap></mets:mets>