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primary topic: SATURATION THICKNESSES FOR SCATTERING BREMSSTRAHLUNG OF ELECTRONS WITH Ee = 13 AND 22 MeV FROM FLAT LEAD TARGETS AND THEIR STATISTICAL PROCESSING OF THE DATA DEPENDENCE

SATURATION THICKNESSES FOR SCATTERING BREMSSTRAHLUNG OF ELECTRONS WITH Ee = 13 AND 22 MeV FROM FLAT LEAD TARGETS AND THEIR STATISTICAL PROCESSING OF THE DATA DEPENDENCE
type: AcademicArticle
type: Article
abstract: In the present work, the dependence of the saturation thickness of the scattered gamma radiation on the detection angles and the orientation of flat targets relative to the direction of the probing beam was observed for the first time.
date: 2026-05-08
status: published
author list: authors
type: EPrint
type: ArticleEPrint
is part of: repository

Center for Tech and Media Research
type: Organization

Multidisciplinary Journal of Science and Technology
type: Collection

N.Kh. Ulugmuradov
type: Person
given name: N.Kh.
family name: Ulugmuradov

Sh.N. Buribaev
type: Person
given name: Sh.N.
family name: Buribaev

U.T. Asatov
type: Person
given name: U.T.
family name: Asatov

HTML Summary of #66736 SATURATION THICKNESSES FOR SCATTERING BREMSSTRAHLUNG OF ELECTRONS WITH Ee = 13 AND 22 MeV FROM FLAT LEAD TARGETS AND THEIR STATISTICAL PROCESSING OF THE DATA DEPENDENCE
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primary topic: SATURATION THICKNESSES FOR SCATTERING BREMSSTRAHLUNG OF ELECTRONS WITH Ee = 13 AND 22 MeV FROM FLAT LEAD TARGETS AND THEIR STATISTICAL PROCESSING OF THE DATA DEPENDENCE