<> <http://www.w3.org/2000/01/rdf-schema#comment> "The repository administrator has not yet configured an RDF license."^^<http://www.w3.org/2001/XMLSchema#string> .
<> <http://xmlns.com/foaf/0.1/primaryTopic> <https://arxiv.universalpublishings.com/id/eprint/66736> .
<https://arxiv.universalpublishings.com/id/eprint/66736> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://purl.org/ontology/bibo/AcademicArticle> .
<https://arxiv.universalpublishings.com/id/eprint/66736> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://purl.org/ontology/bibo/Article> .
<https://arxiv.universalpublishings.com/id/eprint/66736> <http://purl.org/dc/terms/title> "SATURATION THICKNESSES FOR SCATTERING BREMSSTRAHLUNG OF ELECTRONS WITH Ee = 13 AND 22 MeV FROM FLAT LEAD TARGETS AND THEIR STATISTICAL PROCESSING OF THE DATA DEPENDENCE"^^<http://www.w3.org/2001/XMLSchema#string> .
<https://arxiv.universalpublishings.com/id/eprint/66736> <http://purl.org/ontology/bibo/abstract> "In the present work, the dependence of the saturation thickness of the scattered gamma radiation on the detection angles and the orientation of flat targets relative to the direction of the probing beam was observed for the first time."^^<http://www.w3.org/2001/XMLSchema#string> .
<https://arxiv.universalpublishings.com/id/eprint/66736> <http://purl.org/dc/terms/date> "2026-05-08" .
<https://arxiv.universalpublishings.com/id/org/ext-20ef1f289b7920027328009b5eefe52c> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://xmlns.com/foaf/0.1/Organization> .
<https://arxiv.universalpublishings.com/id/org/ext-20ef1f289b7920027328009b5eefe52c> <http://xmlns.com/foaf/0.1/name> "Center for Tech and Media Research"^^<http://www.w3.org/2001/XMLSchema#string> .
<https://arxiv.universalpublishings.com/id/eprint/66736> <http://purl.org/dc/terms/publisher> <https://arxiv.universalpublishings.com/id/org/ext-20ef1f289b7920027328009b5eefe52c> .
<https://arxiv.universalpublishings.com/id/publication/ext-d62a5dbdabc792c15cf76756361a4d36> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://purl.org/ontology/bibo/Collection> .
<https://arxiv.universalpublishings.com/id/publication/ext-d62a5dbdabc792c15cf76756361a4d36> <http://xmlns.com/foaf/0.1/name> "Multidisciplinary Journal of Science and Technology"^^<http://www.w3.org/2001/XMLSchema#string> .
<https://arxiv.universalpublishings.com/id/eprint/66736> <http://purl.org/dc/terms/isPartOf> <https://arxiv.universalpublishings.com/id/publication/ext-d62a5dbdabc792c15cf76756361a4d36> .
<https://arxiv.universalpublishings.com/id/eprint/66736> <http://purl.org/ontology/bibo/status> <http://purl.org/ontology/bibo/status/published> .
<https://arxiv.universalpublishings.com/id/eprint/66736> <http://purl.org/dc/terms/creator> <https://arxiv.universalpublishings.com/id/person/ext-689b73dbf124fb3e0dc376e710af556f> .
<https://arxiv.universalpublishings.com/id/eprint/66736> <http://purl.org/ontology/bibo/authorList> <https://arxiv.universalpublishings.com/id/eprint/66736#authors> .
<https://arxiv.universalpublishings.com/id/eprint/66736#authors> <http://www.w3.org/1999/02/22-rdf-syntax-ns#_1> <https://arxiv.universalpublishings.com/id/person/ext-689b73dbf124fb3e0dc376e710af556f> .
<https://arxiv.universalpublishings.com/id/eprint/66736> <http://purl.org/dc/terms/creator> <https://arxiv.universalpublishings.com/id/person/ext-2d1b672ab375bcef2f2a7f86f3292cf2> .
<https://arxiv.universalpublishings.com/id/eprint/66736> <http://purl.org/ontology/bibo/authorList> <https://arxiv.universalpublishings.com/id/eprint/66736#authors> .
<https://arxiv.universalpublishings.com/id/eprint/66736#authors> <http://www.w3.org/1999/02/22-rdf-syntax-ns#_2> <https://arxiv.universalpublishings.com/id/person/ext-2d1b672ab375bcef2f2a7f86f3292cf2> .
<https://arxiv.universalpublishings.com/id/eprint/66736> <http://purl.org/dc/terms/creator> <https://arxiv.universalpublishings.com/id/person/ext-ae010d5c976ddac45d1003f8d69b65f3> .
<https://arxiv.universalpublishings.com/id/eprint/66736> <http://purl.org/ontology/bibo/authorList> <https://arxiv.universalpublishings.com/id/eprint/66736#authors> .
<https://arxiv.universalpublishings.com/id/eprint/66736#authors> <http://www.w3.org/1999/02/22-rdf-syntax-ns#_3> <https://arxiv.universalpublishings.com/id/person/ext-ae010d5c976ddac45d1003f8d69b65f3> .
<https://arxiv.universalpublishings.com/id/person/ext-2d1b672ab375bcef2f2a7f86f3292cf2> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://xmlns.com/foaf/0.1/Person> .
<https://arxiv.universalpublishings.com/id/person/ext-2d1b672ab375bcef2f2a7f86f3292cf2> <http://xmlns.com/foaf/0.1/givenName> "N.Kh."^^<http://www.w3.org/2001/XMLSchema#string> .
<https://arxiv.universalpublishings.com/id/person/ext-2d1b672ab375bcef2f2a7f86f3292cf2> <http://xmlns.com/foaf/0.1/familyName> "Ulugmuradov"^^<http://www.w3.org/2001/XMLSchema#string> .
<https://arxiv.universalpublishings.com/id/person/ext-2d1b672ab375bcef2f2a7f86f3292cf2> <http://xmlns.com/foaf/0.1/name> "N.Kh. Ulugmuradov"^^<http://www.w3.org/2001/XMLSchema#string> .
<https://arxiv.universalpublishings.com/id/person/ext-ae010d5c976ddac45d1003f8d69b65f3> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://xmlns.com/foaf/0.1/Person> .
<https://arxiv.universalpublishings.com/id/person/ext-ae010d5c976ddac45d1003f8d69b65f3> <http://xmlns.com/foaf/0.1/givenName> "Sh.N."^^<http://www.w3.org/2001/XMLSchema#string> .
<https://arxiv.universalpublishings.com/id/person/ext-ae010d5c976ddac45d1003f8d69b65f3> <http://xmlns.com/foaf/0.1/familyName> "Buribaev"^^<http://www.w3.org/2001/XMLSchema#string> .
<https://arxiv.universalpublishings.com/id/person/ext-ae010d5c976ddac45d1003f8d69b65f3> <http://xmlns.com/foaf/0.1/name> "Sh.N. Buribaev"^^<http://www.w3.org/2001/XMLSchema#string> .
<https://arxiv.universalpublishings.com/id/person/ext-689b73dbf124fb3e0dc376e710af556f> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://xmlns.com/foaf/0.1/Person> .
<https://arxiv.universalpublishings.com/id/person/ext-689b73dbf124fb3e0dc376e710af556f> <http://xmlns.com/foaf/0.1/givenName> "U.T."^^<http://www.w3.org/2001/XMLSchema#string> .
<https://arxiv.universalpublishings.com/id/person/ext-689b73dbf124fb3e0dc376e710af556f> <http://xmlns.com/foaf/0.1/familyName> "Asatov"^^<http://www.w3.org/2001/XMLSchema#string> .
<https://arxiv.universalpublishings.com/id/person/ext-689b73dbf124fb3e0dc376e710af556f> <http://xmlns.com/foaf/0.1/name> "U.T. Asatov"^^<http://www.w3.org/2001/XMLSchema#string> .
<https://arxiv.universalpublishings.com/id/eprint/66736> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://eprints.org/ontology/EPrint> .
<https://arxiv.universalpublishings.com/id/eprint/66736> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://eprints.org/ontology/ArticleEPrint> .
<https://arxiv.universalpublishings.com/id/eprint/66736> <http://purl.org/dc/terms/isPartOf> <https://arxiv.universalpublishings.com/id/repository> .
<https://arxiv.universalpublishings.com/id/eprint/66736> <http://www.w3.org/2000/01/rdf-schema#seeAlso> <https://arxiv.universalpublishings.com/id/eprint/66736/> .
<https://arxiv.universalpublishings.com/id/eprint/66736/> <http://purl.org/dc/elements/1.1/title> "HTML Summary of #66736 \n\nSATURATION THICKNESSES FOR SCATTERING BREMSSTRAHLUNG OF ELECTRONS WITH Ee = 13 AND 22 MeV FROM FLAT LEAD TARGETS AND THEIR STATISTICAL PROCESSING OF THE DATA DEPENDENCE\n\n" .
<https://arxiv.universalpublishings.com/id/eprint/66736/> <http://purl.org/dc/elements/1.1/format> "text/html" .
<https://arxiv.universalpublishings.com/id/eprint/66736/> <http://xmlns.com/foaf/0.1/primaryTopic> <https://arxiv.universalpublishings.com/id/eprint/66736> .