?url_ver=Z39.88-2004&rft_id=oai%3Aojs.pkp.sfu.ca%3Aarticle%2F5429&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.aufirst=Mirzaraimov&rft.aulast=Jakhangir&rft.au=Jakhangir%2C+Mirzaraimov&rft.title=Multidisciplinary+Journal+of+Science+and+Technology&rft.date=30+Oktabr+2025&rft.atitle=DEPENDENCE+OF+THE+RESIDENCE+TIME+OF+CHARGE+CARRIERS+ON+OXYGEN+ATOMS+IN+SILICON+DOPED+WITH+COPPER+AND+IRIDIUM.&rft.genre=article