<mods:mods xsi:schemaLocation="http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-3.xsd" version="3.3" xmlns:mods="http://www.loc.gov/mods/v3" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance"><mods:titleInfo><mods:title>MICROCHIP MARKING RECOGNITION AND IDENTIFICATION USING A COMPUTER VISION SYSTEM MATHEMATICAL MODEL</mods:title></mods:titleInfo><mods:name type="personal"><mods:namePart type="given">Svitlana</mods:namePart><mods:namePart type="family">Maksymova</mods:namePart><mods:role><mods:roleTerm type="text">author</mods:roleTerm></mods:role></mods:name><mods:name type="personal"><mods:namePart type="given">Vladyslav</mods:namePart><mods:namePart type="family">Yevsieiev</mods:namePart><mods:role><mods:roleTerm type="text">author</mods:roleTerm></mods:role></mods:name><mods:name type="personal"><mods:namePart type="given">Amer</mods:namePart><mods:namePart type="family">Abu-Jassar</mods:namePart><mods:role><mods:roleTerm type="text">author</mods:roleTerm></mods:role></mods:name><mods:abstract>The article considers a microcircuit markings recognition and identification using a computer vision system mathematical model that provides automation of electronic component control. An image processing algorithm is proposed, which includes preliminary filtering, binarization and optical character recognition to increase the accuracy of identification. An experimental analysis of the influence of the angle of inclination and the level of illumination on the speed and quality of recognition was carried out, which allowed formulating recommendations on the optimal shooting parameters. The results obtained can be used to create automated quality control systems in electronics production.</mods:abstract><mods:originInfo><mods:dateIssued encoding="iso8601">2025-04-10</mods:dateIssued></mods:originInfo><mods:originInfo><mods:publisher>Center for Tech and Media Research</mods:publisher></mods:originInfo><mods:genre>Maqola</mods:genre></mods:mods>